发明名称 AUTOMATIC MICROSCOPIC FOCUS SYSTEM AND METHOD FOR ANALYSIS OF TRANSPARENT OR LOW CONTRAST SPECIMENS
摘要 A microscope system and method empirically determines the boundaries of the depth of field of an objective lens. The system and method are largely automated, with the manipulation of a specimen to be imaged being carried out by processors and associated equipment. Calculations of the empirical depth of field are also likewise automated. Upon empirically determining the boundaries of the depth of field, the specimen, particularly when transparent or translucent, can be accurately imaged at user-defined depths smaller than the depth of field.
申请公布号 WO2014036276(A3) 申请公布日期 2015.07.16
申请号 WO2013US57311 申请日期 2013.08.29
申请人 NANOTRONICS IMAGING, LLC 发明人 PUTMAN, MATTHEW C;PUTMAN, JOHN B;ARCHER, JEFFREY S;ORLANDO, JULIE A
分类号 G02B21/00 主分类号 G02B21/00
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