发明名称 |
SELF-ALIGNED CONTACT STRUCTURE |
摘要 |
Embodiments of present invention provide a method of forming a semiconductor structure. The method includes forming a semiconductor structure having a first metal layer and a plurality of dielectric layers on top of the first metal layer; creating one or more openings through the plurality of dielectric layers to expose the first metal layer underneath the plurality of dielectric layers; causing the one or more openings to expand downward into the first metal layer and expand horizontally into areas underneath the plurality of dielectric layers; applying a layer of lining material in lining sidewalls of the one or more openings inside the plurality of dielectric layers; and filling the expanded one or more openings with a conductive material. |
申请公布号 |
US2015200137(A1) |
申请公布日期 |
2015.07.16 |
申请号 |
US201414157125 |
申请日期 |
2014.01.16 |
申请人 |
International Business Machines Corporation |
发明人 |
Orozco-Teran Rosa A.;Ramachandran Ravikumar;Fitzsimmons John A.;Arndt Russell H.;Rath David L. |
分类号 |
H01L21/768;H01L29/45;H01L21/28;H01L29/49 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
1. A method comprising:
forming a transistor structure having an aluminum gate and one or more dielectric layers on top of said aluminum gate; creating one or more contact holes through said one or more dielectric layers to expose said aluminum gate underneath said one or more dielectric layers; causing said one or more contact holes to expand into said aluminum gate and horizontally into areas underneath said one or more dielectric layers; and filling said expanded contact holes with a conductive material. |
地址 |
Armonk NY US |