发明名称 SELF-ALIGNED CONTACT STRUCTURE
摘要 Embodiments of present invention provide a method of forming a semiconductor structure. The method includes forming a semiconductor structure having a first metal layer and a plurality of dielectric layers on top of the first metal layer; creating one or more openings through the plurality of dielectric layers to expose the first metal layer underneath the plurality of dielectric layers; causing the one or more openings to expand downward into the first metal layer and expand horizontally into areas underneath the plurality of dielectric layers; applying a layer of lining material in lining sidewalls of the one or more openings inside the plurality of dielectric layers; and filling the expanded one or more openings with a conductive material.
申请公布号 US2015200137(A1) 申请公布日期 2015.07.16
申请号 US201414157125 申请日期 2014.01.16
申请人 International Business Machines Corporation 发明人 Orozco-Teran Rosa A.;Ramachandran Ravikumar;Fitzsimmons John A.;Arndt Russell H.;Rath David L.
分类号 H01L21/768;H01L29/45;H01L21/28;H01L29/49 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method comprising: forming a transistor structure having an aluminum gate and one or more dielectric layers on top of said aluminum gate; creating one or more contact holes through said one or more dielectric layers to expose said aluminum gate underneath said one or more dielectric layers; causing said one or more contact holes to expand into said aluminum gate and horizontally into areas underneath said one or more dielectric layers; and filling said expanded contact holes with a conductive material.
地址 Armonk NY US