发明名称 Surface texture measuring instrument
摘要 <p>A surface texture measuring instrument provided with a near-field measuring unit (30) including a near-field probe (33) that forms a near-field light at a tip end thereof when a laser beam is irradiated, a laser source (35) that generates the laser beam to be irradiated on the near-field probe (33), a detection element (38) that detects scattering effect of the near-field light generated when the near-field probe (33) is moved close to a workpiece (1), and an actuator (32) that displaces the near-field probe (33) and the workpiece (1) in a direction moving close to/away from each other, includes: a laser length-measuring unit (20) that measures a relative distance between a reference position and the workpiece (1) in the vicinity of the tip end of the near-field probe (33) or a relative distance between the reference position and the near-field probe (33).</p>
申请公布号 EP1653477(B1) 申请公布日期 2015.07.15
申请号 EP20050023860 申请日期 2005.11.02
申请人 MITUTOYO CORPORATION 发明人 HIDAKA, KAZUHIKO
分类号 G01Q30/02;G01B11/30;G01Q20/02;G01Q40/00;G01Q60/18;G01Q60/20;G01Q60/22 主分类号 G01Q30/02
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