发明名称 渦電流探傷プローブ、渦電流探傷装置及び渦電流探傷方法
摘要 <p><P>PROBLEM TO BE SOLVED: To improve a detecting sensitivity, in an eddy current probe for flaw detection, of a longitudinal flaw developing in the direction parallel to the scanning direction of the eddy current probe for flaw detection. <P>SOLUTION: Conductive plates EP1 and EP2 of an eddy current probe P for flaw detection are so disposed that the directions of exciting currents ie1 and ie2 are crossed with each other and the directions form±θwith respect to the scanning-direction central line that passes through a center PC of an intersection. The eddy current probe P for flaw detection scans in the direction of the scanning direction SC. Eddy currents iu11 and iu21 become same phase, eddy currents iu22 and iu12 become same phase, eddy currents iu11 and iu22 become reversed phases, and eddy currents iu21 and iu12 become reversed phases. An eddy current flaw detection signal caused by a longitudinal flaw increases, while an eddy current flaw detection signal caused by an orthogonal flaw is suppressed. <P>COPYRIGHT: (C)2012,JPO&INPIT</p>
申请公布号 JP5750208(B2) 申请公布日期 2015.07.15
申请号 JP20100274130 申请日期 2010.12.08
申请人 发明人
分类号 G01N27/90 主分类号 G01N27/90
代理机构 代理人
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