发明名称 二種類の仕事関数メタルを備える半導体装置
摘要 <p>A method of forming a semiconductor device includes forming a dummy metal gate layer including work function metals directly on a base insulator, diffusing the work function metals into the base insulator by annealing, removing the dummy metal gate layer by a wet etching, forming a metal gate on the base insulator, and forming a high-k insulator on the metal gate.</p>
申请公布号 JP5749501(B2) 申请公布日期 2015.07.15
申请号 JP20110009145 申请日期 2011.01.19
申请人 发明人
分类号 H01L21/336;H01L21/8238;H01L27/092;H01L29/78 主分类号 H01L21/336
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