发明名称 |
Nonvolatile memory device |
摘要 |
A nonvolatile memory device includes an operation control unit, a reference voltage generating unit, and a sensing unit. The operation control unit is configured to select a unit cell from unit cells to perform reading and writing operations. The reference voltage generating unit is configured to voltage-divide a read voltage using series-connected resistors and generate a reference voltage based on the voltage-divided read voltage. The sensing unit is configured to compare a size of a voltage through an e-fuse of the selected unit cell based on the read voltage with the reference voltage, and sense data of the e-fuse of the selected unit cell. The nonvolatile memory device also includes a read current supply unit configured to output the read voltage to the unit cells during a reading operation of the nonvolatile memory device. |
申请公布号 |
US9082475(B2) |
申请公布日期 |
2015.07.14 |
申请号 |
US201213724536 |
申请日期 |
2012.12.21 |
申请人 |
Magnachip Semiconductor, Ltd. |
发明人 |
Kim Jae-woon |
分类号 |
G11C17/16;G11C7/22;G11C17/18;G11C7/14;G11C29/02 |
主分类号 |
G11C17/16 |
代理机构 |
NSIP Law |
代理人 |
NSIP Law |
主权项 |
1. A nonvolatile memory device, comprising:
unit cells comprising an e-fuse and an input unit configured to provide the e-fuse with a write voltage during a writing operation of the nonvolatile memory device; a read current supply unit which provides a read voltage to the unit cells during reading operation of the nonvolatile memory device; an operation control unit configured to select a unit cell from the unit cells to perform reading and writing operations; a reference voltage generating unit configured to voltage-divide the read voltage using series-connected resistors and generate a reference voltage based on the voltage-divided read voltage; and a sensing unit configured to compare a size of a voltage through an e-fuse of the selected unit cell based on the read voltage with the reference voltage, and sense data of the e-fuse of the selected unit cell, wherein the e-fuse is configured to store 1-bit information and the unit cells comprise a first switching device configured to selectively output the read voltage to the e-fuse of the unit cells, a second switching device configured to enable an electric current to flow through the e-fuse of the unit cells according to the read voltage, and a third switching device configured to enable electric current to flow through the e-fuse according to the write voltage. |
地址 |
Cheongju-si KR |