| 发明名称 | Analog-to-digital converter and self-diagnosis method for analog-to-digital converter | ||
| 摘要 | An n-bit analog-to-digital converter includes a comparator that compares an analog input voltage with a comparison voltage; and a digital-to-analog converter that generates the comparison voltage in response to a result of the comparator, wherein the analog-to-digital converter outputs n-bit digital data corresponding to the analog input voltage, and wherein the analog-to-digital converter outputs a self-diagnosis result in such a way that the digital-to-analog converter generates a self-diagnosis voltage in response to the n-bit digital data and the comparator compares the analog input voltage with the self-diagnosis voltage. | ||
| 申请公布号 | US9083367(B2) | 申请公布日期 | 2015.07.14 |
| 申请号 | US201414489029 | 申请日期 | 2014.09.17 |
| 申请人 | Renesas Electronics Corporation | 发明人 | Arai Kazuyuki;Sezaki Isao |
| 分类号 | H03M1/10;H03M1/46 | 主分类号 | H03M1/10 |
| 代理机构 | McGinn IP Law Group, PLLC | 代理人 | McGinn IP Law Group, PLLC |
| 主权项 | 1. An n-bit analog-to-digital converter comprising: a comparator that compares an analog input voltage with a comparison voltage; and a digital-to-analog converter that generates the comparison voltage in response to a result of the comparator, wherein the analog-to-digital converter outputs n-bit digital data corresponding to the analog input voltage, and wherein the analog-to-digital converter outputs a self-diagnosis result in such a way that the digital-to-analog converter generates a self-diagnosis voltage in response to the n-bit digital data and the comparator compares the analog input voltage with the self-diagnosis voltage. | ||
| 地址 | Kawasaki-shi, Kanagawa JP | ||