发明名称 Bypass capacitors for high voltage bias power in the mid frequency RF range
摘要 A system for decoupling arcing RF signals in a plasma chamber including a top electrode, an electrostatic chuck for supporting a semiconductor wafer, and a capacitor coupled between the at least one of a plurality of clamping electrodes in the surface of the electrostatic chuck and a baseplate of the electrostatic chuck, the capacitor having a capacitance of greater than about 19 nanofarads, the capacitor disposed within an interior volume of the electrostatic chuck. A method of decoupling arcing RF signals in a plasma chamber is also disclosed.
申请公布号 US9083182(B2) 申请公布日期 2015.07.14
申请号 US201213684065 申请日期 2012.11.21
申请人 Lam Research Corporation 发明人 Sato Arthur
分类号 H01T23/00;H02H3/46;H05F3/00;H01J37/32;H01L21/67;H01L21/687;H01L21/683 主分类号 H01T23/00
代理机构 Martine Penilla Group, LLP 代理人 Martine Penilla Group, LLP
主权项 1. A system for decoupling arcing RF signals in a plasma chamber comprising: a plasma chamber including: a top electrode;an electrostatic chuck for supporting a semiconductor wafer; anda capacitor coupled between the at least one of a plurality of clamping electrodes in the surface of the electrostatic chuck and a baseplate of the electrostatic chuck, the capacitor having a capacitance of greater than about 19 nanofarads, the capacitor disposed within an interior volume of the electrostatic chuck;a plurality of lift pins supported in a corresponding plurality of lift pin holes in the surface of the electrostatic chuck, wherein each one of the plurality of lift pins has a clearance of less than about 0.011 inches (0.25 mm) between a corresponding side in a corresponding one of a plurality of lift pin holes in the surface of the electrostatic chuck.
地址 Fremont CA US