发明名称 |
Backside CMOS compatible BioFET with no plasma induced damage |
摘要 |
The present disclosure provides a bio-field effect transistor (BioFET) device and methods of fabricating a BioFET and a BioFET device. The method includes forming a BioFET using one or more process steps compatible with or typical to a complementary metal-oxide-semiconductor (CMOS) process. The BioFET device includes a gate structure disposed on a first surface of a substrate and an interface layer formed on a second surface of the substrate. The substrate is thinned from the second surface to expose a channel region before forming the interface layer. |
申请公布号 |
US9080969(B2) |
申请公布日期 |
2015.07.14 |
申请号 |
US201414281100 |
申请日期 |
2014.05.19 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Liu Yi-Shao;Cheng Chun-Ren;Chen Ching-Ray;Chang Yi-Hsien;Lai Fei-Lung;Cheng Chun-Wen |
分类号 |
G01N27/403;G01N27/414;H01L29/66 |
主分类号 |
G01N27/403 |
代理机构 |
Slater & Matsil, L.L.P. |
代理人 |
Slater & Matsil, L.L.P. |
主权项 |
1. A device, comprising:
a carrier substrate; a first BioFET device attached to the carrier substrate, the first BioFET device including:
a gate structure on a first side of a semiconductor substrate;a source region and a drain region in the semiconductor substrate adjacent to the gate structure;a channel region interposing the source and drain regions and underlying the gate structure;a sensing film directly on and covering at least a portion of the channel region on a second side of the semiconductor substrate; and a microfluidic channel or microfluidic well disposed over the sensing film. |
地址 |
Hsin-Chu TW |