发明名称 Backside CMOS compatible BioFET with no plasma induced damage
摘要 The present disclosure provides a bio-field effect transistor (BioFET) device and methods of fabricating a BioFET and a BioFET device. The method includes forming a BioFET using one or more process steps compatible with or typical to a complementary metal-oxide-semiconductor (CMOS) process. The BioFET device includes a gate structure disposed on a first surface of a substrate and an interface layer formed on a second surface of the substrate. The substrate is thinned from the second surface to expose a channel region before forming the interface layer.
申请公布号 US9080969(B2) 申请公布日期 2015.07.14
申请号 US201414281100 申请日期 2014.05.19
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Liu Yi-Shao;Cheng Chun-Ren;Chen Ching-Ray;Chang Yi-Hsien;Lai Fei-Lung;Cheng Chun-Wen
分类号 G01N27/403;G01N27/414;H01L29/66 主分类号 G01N27/403
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A device, comprising: a carrier substrate; a first BioFET device attached to the carrier substrate, the first BioFET device including: a gate structure on a first side of a semiconductor substrate;a source region and a drain region in the semiconductor substrate adjacent to the gate structure;a channel region interposing the source and drain regions and underlying the gate structure;a sensing film directly on and covering at least a portion of the channel region on a second side of the semiconductor substrate; and a microfluidic channel or microfluidic well disposed over the sensing film.
地址 Hsin-Chu TW