发明名称 |
Synchronous semiconductor memory device having delay locked loop circuit and method of controlling the delay locked loop circuit |
摘要 |
An operating method of a delay locked loop (DLL) circuit for a semiconductor memory device is disclosed. The DLL circuit may include a plurality of sub-circuits. The method may include calculating an additive latency value based on predetermined parameters, and controlling a set of the plurality of sub-circuits of the DLL circuit to be maintained in a turn-off state based on the calculated additive latency value, during a period of time after the semiconductor device receives an operation command in a power saving mode. |
申请公布号 |
US9082506(B2) |
申请公布日期 |
2015.07.14 |
申请号 |
US201414204444 |
申请日期 |
2014.03.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Na Tae-Sik |
分类号 |
G11C7/00;G11C5/14;G11C8/00;G11C8/16;G11C11/4076;G11C5/04;G11C7/22;G11C11/4074;G11C8/18 |
主分类号 |
G11C7/00 |
代理机构 |
Muir Patent Law, PLLC |
代理人 |
Muir Patent Law, PLLC |
主权项 |
1. An operating method of a delay locked loop (DLL) circuit for a semiconductor memory device, the DLL circuit including a plurality of sub-circuits, the method comprising:
calculating an additive latency value based on predetermined parameters; and controlling a set of the plurality of sub-circuits of the DLL circuit to be maintained in a turn-off state based on the calculated additive latency value, during a period of time after the semiconductor memory device receives an operation command in a power saving mode. |
地址 |
Samsung-ro, Yeongtong-gu, Suwon si, Gyeonggi-do KR |