发明名称 Synchronous semiconductor memory device having delay locked loop circuit and method of controlling the delay locked loop circuit
摘要 An operating method of a delay locked loop (DLL) circuit for a semiconductor memory device is disclosed. The DLL circuit may include a plurality of sub-circuits. The method may include calculating an additive latency value based on predetermined parameters, and controlling a set of the plurality of sub-circuits of the DLL circuit to be maintained in a turn-off state based on the calculated additive latency value, during a period of time after the semiconductor device receives an operation command in a power saving mode.
申请公布号 US9082506(B2) 申请公布日期 2015.07.14
申请号 US201414204444 申请日期 2014.03.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Na Tae-Sik
分类号 G11C7/00;G11C5/14;G11C8/00;G11C8/16;G11C11/4076;G11C5/04;G11C7/22;G11C11/4074;G11C8/18 主分类号 G11C7/00
代理机构 Muir Patent Law, PLLC 代理人 Muir Patent Law, PLLC
主权项 1. An operating method of a delay locked loop (DLL) circuit for a semiconductor memory device, the DLL circuit including a plurality of sub-circuits, the method comprising: calculating an additive latency value based on predetermined parameters; and controlling a set of the plurality of sub-circuits of the DLL circuit to be maintained in a turn-off state based on the calculated additive latency value, during a period of time after the semiconductor memory device receives an operation command in a power saving mode.
地址 Samsung-ro, Yeongtong-gu, Suwon si, Gyeonggi-do KR