发明名称 |
Set pulse for phase change memory programming |
摘要 |
A memory device and method for programming the memory device, including a method for a melting phase change memory cell by applying an electronic signal at a first value and subsequently decreasing the signal value. The phase change memory cell can be substantially crystallized after the decrease in signal value. |
申请公布号 |
US9082477(B2) |
申请公布日期 |
2015.07.14 |
申请号 |
US201313886564 |
申请日期 |
2013.05.03 |
申请人 |
Micron Technology, Inc. |
发明人 |
Thiruvengadam Aswin;Melton William;Fackenthal Rich;Oen Andrew |
分类号 |
G11C7/00;G11C13/00 |
主分类号 |
G11C7/00 |
代理机构 |
Knobbe, Martens Olson & Bear LLP |
代理人 |
Knobbe, Martens Olson & Bear LLP |
主权项 |
1. A method comprising:
melting phase change material of a phase change memory (PCM) cell by applying an electronic signal at a first signal value to a heater of the PCM cell; subsequently ramping down a signal value of the electronic signal from the first signal value to a second signal value, where ramping down occurs at a first ramp-down rate; and ramping down the signal value of the electronic signal from the second signal value to a third signal at a second ramp-down rate, wherein the second ramp-down rate is different from the first ramp-down rate; wherein the melted phase change material is substantially crystallized after reaching the second signal value. |
地址 |
Boise ID US |