发明名称 Variable resistive memory device including vertical channel PMOS transistor and method of manufacturing the same
摘要 A semiconductor device having a vertical channel, a variable resistive memory device including the same, and a method of manufacturing the same are provided. The semiconductor device having a vertical channel includes a vertical pillar formed on a semiconductor substrate and including an inner portion and an outer portion surrounding the inner portion, junction regions formed in the outer portion of the vertical pillar, and a gate formed to surround the vertical pillar. The inner portion of the vertical pillar has a lattice constant smaller than that of the outer portion of the vertical pillar.
申请公布号 US9082697(B2) 申请公布日期 2015.07.14
申请号 US201314076921 申请日期 2013.11.11
申请人 SK Hynix Inc. 发明人 Park Nam Kyun
分类号 H01L21/336;H01L27/24;H01L29/66;H01L29/78;H01L27/22 主分类号 H01L21/336
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A semiconductor device, comprising: a vertical pillar formed on a semiconductor substrate and including an inner portion and an outer portion surrounding the inner portion; a drain formed in an upper outer portion of the vertical pillar; a source formed in a lower outer portion of the vertical pillar; and a gate formed to surround the vertical pillar, wherein the inner portion of the vertical pillar has a lattice constant smaller than that of the outer portion of the vertical pillar and the inner portion is subjected to a compressed stress based on a junction with the drain and source which are formed in the outer portion of the vertical pillar.
地址 Gyeonggi-do KR