发明名称 |
Variable resistive memory device including vertical channel PMOS transistor and method of manufacturing the same |
摘要 |
A semiconductor device having a vertical channel, a variable resistive memory device including the same, and a method of manufacturing the same are provided. The semiconductor device having a vertical channel includes a vertical pillar formed on a semiconductor substrate and including an inner portion and an outer portion surrounding the inner portion, junction regions formed in the outer portion of the vertical pillar, and a gate formed to surround the vertical pillar. The inner portion of the vertical pillar has a lattice constant smaller than that of the outer portion of the vertical pillar. |
申请公布号 |
US9082697(B2) |
申请公布日期 |
2015.07.14 |
申请号 |
US201314076921 |
申请日期 |
2013.11.11 |
申请人 |
SK Hynix Inc. |
发明人 |
Park Nam Kyun |
分类号 |
H01L21/336;H01L27/24;H01L29/66;H01L29/78;H01L27/22 |
主分类号 |
H01L21/336 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A semiconductor device, comprising:
a vertical pillar formed on a semiconductor substrate and including an inner portion and an outer portion surrounding the inner portion; a drain formed in an upper outer portion of the vertical pillar; a source formed in a lower outer portion of the vertical pillar; and a gate formed to surround the vertical pillar, wherein the inner portion of the vertical pillar has a lattice constant smaller than that of the outer portion of the vertical pillar and the inner portion is subjected to a compressed stress based on a junction with the drain and source which are formed in the outer portion of the vertical pillar. |
地址 |
Gyeonggi-do KR |