发明名称 |
Nonvolatile memory device using resistance material and method of driving the nonvolatile memory device |
摘要 |
Provided is a nonvolatile memory device using a resistance material and a method of driving the nonvolatile memory device. The nonvolatile memory device comprises a resistive memory cell which stores multiple bits; a sensing node; a clamping unit coupled between the resistive memory cell and the sensing node and provides a clamping bias to the resistive memory cell; a compensation unit which provides a compensation current to the sensing node; a sense amplifier coupled to the sensing node and senses a change in a level of the sensing node; and an encoder which codes an output value of the sense amplifier in response to a first clock signal. The clamping bias varies over time. The compensation current is constant during a read period. |
申请公布号 |
US9082478(B2) |
申请公布日期 |
2015.07.14 |
申请号 |
US201313940856 |
申请日期 |
2013.07.12 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Lee Sung-Yeon;Lee Yeong-Taek |
分类号 |
G11C13/00;G11C11/16;G11C11/56 |
主分类号 |
G11C13/00 |
代理机构 |
Onello & Mello, LLP. |
代理人 |
Onello & Mello, LLP. |
主权项 |
1. A nonvolatile memory device comprising:
a resistive memory cell which stores multiple bits; a sensing node, wherein a cell current flows from the sensing node through the resistive memory cell; a clamping unit coupled between the resistive memory cell and the sensing node, the clamping unit providing a clamping bias to the resistive memory cell, wherein the clamping bias varies over time; a compensation unit which provides a compensation current to the sensing node, wherein the compensation current is constant during a read period; a sense amplifier coupled to the sensing node, the sense amplifier sensing a change in a level of the sensing node at a period of time when the cell current is equal to the compensation current; and an encoder which codes an output value of the sense amplifier in response to a first clock signal. |
地址 |
KR |