发明名称 Sample analyzer and method for controlling a sample analyzer
摘要 A sample analyzer which transports and analyzes samples, includes: a first measurement apparatus which measures samples; a second measurement apparatus which is arranged downstream, in a transport direction, from the first measurement apparatus, and which measures samples; a transporting apparatus which transports samples to a first supply position for supplying a sample to the first measurement apparatus, and to a second supply position for supplying a sample to the second measurement apparatus; and a controller which controls transportation of a sample present at the first supply position, in accordance with a processing status of a sample present at the second supply position.
申请公布号 US9080996(B2) 申请公布日期 2015.07.14
申请号 US201213629045 申请日期 2012.09.27
申请人 SYSMEX CORPORATION;ARKRAY, INC. 发明人 Izumi Takayoshi;Tsutsumida Keisuke;Mizumoto Toru;Nakajima Shinya;Fujimoto Koji
分类号 G01N35/02;G01N33/493;G01N35/04;G01N35/00 主分类号 G01N35/02
代理机构 Brinks Gilson & Lione 代理人 Brinks Gilson & Lione
主权项 1. A sample analyzer which transports and analyzes samples, comprising: a first measurement apparatus configured to test samples; a second measurement apparatus arranged downstream of the first measurement apparatus in a transport direction, and configured to test at least some of the samples that have been tested by the first measurement apparatus and are found, from test results from the first measurement apparatus, necessary to be further tested; a transporting apparatus configured to transport the samples in a rack along a transport path which includes a first supply position at which the samples are tested at the first measurement apparatus, and a second supply position, located downstream of the first supply position, at which the at least some of the samples are tested at the second measurement apparatus, wherein the rack has a line of holders at a regular pitch for holding a predetermined number of the samples, and the first and second supply positions are separated along the transport path at a distance equal to a distance between first and second samples stored in the rack such that the first and second samples are simultaneously positioned, respectively, at the first and second supply positions, and further wherein the first and second measurement apparatuses are operable to conduct their tests in parallel on the first and second samples positioned at the first and second supply positions; and a controller comprising a memory that stores programs for programming the controller, the controller being programmed to coordinate transportation of the rack with progresses of the tests performed by the first measurement apparatus on the first sample positioned at the first supply position and by the second measurement apparatus on the second sample positioned at the second supply position, the controller further programmed to: keep the rack from being transported until an aspiration is completed from the second sample positioned at the second supply position if an aspiration is completed from the first sample at the first supply position but an aspiration is not completed from the second sample at the second supply position; and after an aspiration is completed from the first sample at the first supply position, transport the rack downstream by one pitch to advance a next sample located in the rack by one pitch upstream of the second sample to the second supply position, without transporting the rack upstream to move the second sample back to the first supply position, when an aspiration becomes completed from the second sample at the second supply position or it is determined that no aspiration is needed at the second supply position.
地址 Hyogo JP