A X-RAY ANALYTICAL APPARATUS CAPABLE OF ELONGATING GRAPHENE SPECIMEN AND AN ANALYTICAL METHOD OF EXTREME SUPER-THIN GRAPHENE USING THE SAME

摘要

The present invention relates to an X-ray analyzing apparatus capable of elongating a graphene specimen; and a crystallographic analytical method of extreme ultra thin graphene (thickness is 0.35 nm-3 nm) using the same. The present invention has an effect of X-ray analyzing while elongating a graphene specimen to identify physical properties of a graphene ultra fine thin film which was an unknown area meanwhile.