CANTILEVER CONTACT PROBE FOR A TESTING HEAD

摘要

A cantilever contact probe comprises at least a probe body and a hook-shaped end portion, being joined to the probe body and ending with a slanted section being configured as a hook. The end portion is bent at a bending point having a suitable inclination of the hooked slanted section with respect to a longitudinal extension axis of the probe and ends with a contact tip being able to assure a mechanical and electrical contact with a contact pad of a device under test. Suitably, the probe comprises at least a reduced portion having a first area with at least a first size being smaller than a corresponding first size of a second area of the probe in a section which does not comprise the reduced portion, along a side by side placing direction of the probes within a testing head. The reduced portion is substantially reduced along its sides thus forming an area having a reduced cross size being placed edgeways.

主权项

1. A cantilever contact probe comprising:
a probe body; a hook-shaped end portion ending with a slanted section and being joined to the probe body, the slanted section being configured as a hook, the hook-shaped end portion being bent at a bending point having an inclination of the hooked slanted section with respect to a longitudinal extension axis of the probe body and the hooked slanted section ending with a contact tip, the contact tip being able to assure a mechanical and electrical contact with a contact pad of a device under test, and a first reduced portion having a first area with a first size smaller than a corresponding first size of a second area of the probe in a section which does not comprise the first reduced portion, along a side by side placing direction of probes within a testing head, the first reduced portion having substantially reduced sides thus forming an area having a reduced cross size.