发明名称 HIGH-K/METAL GATE CMOS TRANSISTORS WITH TIN GATES
摘要 In described examples, an integrated circuit is formed with a thick TiN metal gate (146) with a work function greater than 4.85 eV and with a thin TiN metal gate (156) with a work function less than 4.25 eV. An integrated circuit is formed with a replacement gate PMOS TiN metal gate transistor (170) with a workfunction greater than 4.85 eV and with a replacement gate NMOS TiN metal gate transistor (172) with a workfunction less than 4.25 eV. An integrated circuit is formed with a gate first PMOS TiN metal gate transistor with a workfunction greater than 4.85 eV and with a gate first NMOS TiN metal gate transistor with a workfunction less than 4.25 eV.
申请公布号 WO2015103412(A1) 申请公布日期 2015.07.09
申请号 WO2014US73032 申请日期 2014.12.31
申请人 TEXAS INSTRUMENTS INCORPORATED;TEXAS INSTRUMENTS JAPAN LIMITED 发明人 NIIMI, HIROAKI;KIRKPATRICK, BRIAN, K.
分类号 H01L21/8238;B82Y40/00 主分类号 H01L21/8238
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