发明名称 |
TIME-OF-FLIGHT ANALYSIS OF A CONTINUOUS BEAM OF IONS BY A DETECTOR ARRAY |
摘要 |
Systems and methods are provided for time-of-flight analysis of a continuous beam of ions by a detector array. A sample is ionized using an ion source to produce a continuous beam of ions. An electric field is applied to the continuous beam of ions using an accelerator to produce an accelerated beam of ions. A rotating magnetic and/or electric field is applied to the accelerated beam to separate ions with different mass-to-charge ratios over an area of a two- dimensional detector using a deflector located between the accelerator and the two-dimensional detector. An arrival time and a two-dimensional arrival position of each ion of the accelerated beam are recorded using the two-dimensional detector. Alternatively, an electric field that is periodic with time is applied in order to sweep the accelerated beam over a periodically repeating path on the two- dimensional rectangular detector. |
申请公布号 |
WO2015101820(A1) |
申请公布日期 |
2015.07.09 |
申请号 |
WO2014IB02684 |
申请日期 |
2014.12.06 |
申请人 |
DH TECHNOLOGIES DEVELOPMENT PTE. LTD. |
发明人 |
GROTHE, ROBERT, ALOIS, JR. |
分类号 |
H01J49/40 |
主分类号 |
H01J49/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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