| 发明名称 |
SEMICONDUCTOR TEST DEVICE AND METHOD OF OPERATING THE SAME |
| 摘要 |
A method of operating a semiconductor test device includes transferring a first device under test (DUT) from a load tray to a first load shuttle. The first DUI is transferred from the first load shuttle to a first test board and a second DUT is transferred from the load tray to a second load shuttle. |
| 申请公布号 |
US2015192638(A1) |
申请公布日期 |
2015.07.09 |
| 申请号 |
US201514590135 |
申请日期 |
2015.01.06 |
| 申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG Suk Hyun |
| 分类号 |
G01R31/28;G01R31/26 |
主分类号 |
G01R31/28 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of operating a semiconductor test device, the method comprising:
transferring a first device under test (DUT) from a load tray to a first load shuttle; and transferring the first DUT from the first load shuttle to a first test board and transferring a second DUT from the load tray to a second load shuttle. |
| 地址 |
Suwon-si KR |
