发明名称 |
RESISTIVE MEMORY DEVICE CAPABLE OF IMPROVING SENSING MARGIN OF DATA |
摘要 |
A resistive memory device includes a cell block having a plurality of unit memory cells in which a resistive element and a cell select element are connected to each other in series, the cell block operating in response to a word line, a bit line, and a source line, and a dummy line, when different interconnection layers form the source line and the bit line, respectively, connected to one of the interconnection layers which is formed at a lower side the remaining interconnection layer between the interconnection layers for the source line and the bit line, wherein the dummy line has a resistance lower than a resistance of the lower interconnection layer. |
申请公布号 |
US2015194200(A1) |
申请公布日期 |
2015.07.09 |
申请号 |
US201414510629 |
申请日期 |
2014.10.09 |
申请人 |
SUH Ki-Seok;LEE Jae-kyu |
发明人 |
SUH Ki-Seok;LEE Jae-kyu |
分类号 |
G11C11/16;G11C5/08 |
主分类号 |
G11C11/16 |
代理机构 |
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代理人 |
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主权项 |
1. A resistive memory device comprising:
a cell block comprising a plurality of unit memory cells in which a resistive element and a cell select element are connected to each other in series, the cell block being configured to operate in response to a word line, a bit line, and a source line; and a dummy line, when different interconnection layers are configured to form the source line and the bit line, connected to one of the interconnection layers formed at a lower side of a remaining interconnection layer, the remaining interconnection layer being between the interconnection layers forming the source line and the bit line, wherein the dummy line has a lower resistance than a resistance of the lower interconnection layer. |
地址 |
Hwaseong-si KR |