Probe Card

摘要

An apparatus and a method are disclosed herein. The apparatus is disclosed that includes a probe head and a circuit board. The probe head includes a metal housing and pins. The pins penetrate through the metal housing. The circuit board is configured to test a semiconductor device and includes a ground pad. The ground pad is electrically coupled between the metal housing and the circuit board.

主权项

1. An apparatus, comprising:
a probe head, comprising:
a metal housing; anda plurality of pins penetrating through the metal housing; and a circuit board configured to test a semiconductor device, wherein the pins are configured to electrically connect the semiconductor device to the circuit board, the circuit board comprising:
a ground pad electrically coupled between the metal housing and the circuit board.