发明名称 STATIC RANDOM ACCESS MEMORY CELL AND FORMING METHOD THEREOF
摘要 A SRAM cell and a forming method thereof are provided. The SRAM cell includes: a pull-up transistor, a pull-down transistor, a pass gate transistor, a tensile stress film which covers the pull-up transistor and the pull-down transistor, and an interlayer dielectric isolating layer which covers the tensile stress film and the pass gate transistor. The method includes: providing a semiconductor substrate; forming a pull-up transistor, a pull-down transistor and a pass gate transistor on the semiconductor substrate; forming a tensile stress film covering the pull-up and pull-down transistors; and forming an interlayer dielectric isolating layer covering the tensile stress film and the pass gate transistor. Write margin of the SRAM cell may be increased and an area of the SRAM cell may be reduced.
申请公布号 US2015194431(A1) 申请公布日期 2015.07.09
申请号 US201414580967 申请日期 2014.12.23
申请人 Shanghai Huahong Grace Semiconductor Manufacturing Corporation 发明人 HU Jian
分类号 H01L27/11;H01L29/78;H01L21/02 主分类号 H01L27/11
代理机构 代理人
主权项 1. A static random access memory (SRAM) cell, comprising: a pull-up transistor, a pull-down transistor, a pass gate transistor, a tensile stress film which covers the pull-up transistor and the pull-down transistor, and an interlayer dielectric isolating layer which covers the tensile stress film and the pass gate transistor.
地址 Shanghai CN