发明名称 ION OPTICS SYSTEM FOR PLASMA MASS SPECTROMETER
摘要 PROBLEM TO BE SOLVED: To reduce background noise of a mass spectrometer, by removing neutral particles from an ion beam without reducing measurement sensitivity to ions to be measured as much as possible.SOLUTION: A mass spectrometer includes: plasma generation means for generating plasma for ionizing an introduced sample; interface means for drawing plasma into a vacuum; ion lens means for drawing out ions, as an ion beam, from the plasma and guiding them; collision/reaction cell means for removing interference ions from the ion beam; mass spectrometric analysis means for making predetermined ions from an ion beam from the collision/reaction cell means pass through, on the basis of a mass-to-charge ratio, along a first axis; and detection means for detecting the ions. The mass spectrometer includes ion deflection means prior to the mass spectrometric analysis means, and also includes ion deflection means prior to the ion detection means posterior to the mass spectrometric analysis means.
申请公布号 JP2015128032(A) 申请公布日期 2015.07.09
申请号 JP20130273544 申请日期 2013.12.27
申请人 AGILENT TECHNOLOGIES INC 发明人 HIRANO ICHIJI;KITAMOTO ATSUSHI
分类号 H01J49/06;G01N27/62;H01J49/22;H01J49/42 主分类号 H01J49/06
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