发明名称 パネルテストのためのプローブユニット
摘要 <p>There is provided a probe unit for testing a panel. The probe unit includes a body block and a flexible printed circuit board (FPCB). The body block with a bottom on which a taped-automated-bonded (TAB) integrated circuit (IC) used in the panel is mounted, the TAB IC in contact with leads of the panel. On a side opposite to a contact portion between the TAB IC and the panel, there is formed a buffer block maintaining flatness of the contact portion and providing elasticity there to. The FPCB is electrically connected to a rear of the TAB IC and transmits a test signal to the panel via the TAB IC.</p>
申请公布号 JP5746060(B2) 申请公布日期 2015.07.08
申请号 JP20110553943 申请日期 2010.03.08
申请人 发明人
分类号 G01R1/073;G02F1/13;G02F1/1345;G09F9/00 主分类号 G01R1/073
代理机构 代理人
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