发明名称 |
Method and system to measure and represent the measured value of a limit in terms of another measurement in a signal measurement system |
摘要 |
<p>Embodiments of the invention provide a system and method to measure and represent the measured value of a limit in terms of another measurement, such as clock values or cycles of the system. The system can include, for example, a test and measurement instrument such as an oscilloscope. In another embodiment of the present invention, slew rate de-rated values may be automatically determined through the use of configurable lookup tables.</p> |
申请公布号 |
EP2253965(B1) |
申请公布日期 |
2015.07.08 |
申请号 |
EP20100250927 |
申请日期 |
2010.05.14 |
申请人 |
TEKTRONIX, INC. |
发明人 |
GRN, PRASANTH;PONGCHED, PECHLUCK;RAGHAVENDRAN, N.;GUENTHER, MARK L.;SRI, KRISHNA N.H.;AJGAONKAR, MANISHA |
分类号 |
G01R13/02;G01R31/317 |
主分类号 |
G01R13/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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