发明名称 Method and system to measure and represent the measured value of a limit in terms of another measurement in a signal measurement system
摘要 <p>Embodiments of the invention provide a system and method to measure and represent the measured value of a limit in terms of another measurement, such as clock values or cycles of the system. The system can include, for example, a test and measurement instrument such as an oscilloscope. In another embodiment of the present invention, slew rate de-rated values may be automatically determined through the use of configurable lookup tables.</p>
申请公布号 EP2253965(B1) 申请公布日期 2015.07.08
申请号 EP20100250927 申请日期 2010.05.14
申请人 TEKTRONIX, INC. 发明人 GRN, PRASANTH;PONGCHED, PECHLUCK;RAGHAVENDRAN, N.;GUENTHER, MARK L.;SRI, KRISHNA N.H.;AJGAONKAR, MANISHA
分类号 G01R13/02;G01R31/317 主分类号 G01R13/02
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