发明名称 |
PHOTOLITHOGRAPHIC METHODS |
摘要 |
Disclosed is a method for forming an electronic device sequentially comprising the steps of: (a) providing a semiconductor substrate including one or more layer going to be patterned; (b) forming a photoresist layer formed with a composition including a matrix polymer including a unit having acid-unstable group, a photoacid generating agent, and an organic solvent; (c) coating an overcoat composition including a quanching polymer and an organic solvent including a unit having a base portion effect to neutralizing acid generated by the photoacid generating agent on a surface area of the photoresist layer; (d) exposing the photoresist layer to an activation radiating beam; (e) heating the substrate in a baking process after exposure; and (f) developing the exposed film with an organic solvent developing agent. |
申请公布号 |
KR20150079487(A) |
申请公布日期 |
2015.07.08 |
申请号 |
KR20140195942 |
申请日期 |
2014.12.31 |
申请人 |
ROHM AND HAAS ELECTRONIC MATERIALS, L.L.C. |
发明人 |
PARK JONG KEUN;LEE CHRISTOPHER NAM;ANDES CECILY;LEE CHOONG BONG |
分类号 |
H01L21/027;G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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