发明名称 SEMICONDUCTOR MEMORY APPARATUS AND TEST METHOD USING THE SAME
摘要 <p>The present invention comprises: first data outputted from a first data storage area; second data outputted from a second data storage area; a data comparison unit for generating a comparison result signal by comparing whether the first data and the second data are the same; a timing control unit for latching the comparison result signal in response to a clock and latency signal and outputting the latched signal as a comparison signal; and a data output unit for outputting data as output data by reversing the first data in response to the comparison signal when being tested and outputting the first data as output data when not being tested.</p>
申请公布号 KR20150078012(A) 申请公布日期 2015.07.08
申请号 KR20130167031 申请日期 2013.12.30
申请人 SK HYNIX INC. 发明人 LIM, YU RI;KIM, JAE IL
分类号 G11C29/00;G11C7/10 主分类号 G11C29/00
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