| 摘要 |
Disclosed herein is an X-ray topography apparatus including an X-ray source 11, a multilayer film mirror 12 (which may be a multilayer film monochromator (50, Fig.2), a slit 13, a two-dimensional X-ray detector 21, and a sample moving device 20 that sequentially moves the sample to a plurality of step positions. The X-ray source is a minute focal spot. The multilayer film mirror forms monochromatic, collimated, high-intensity X-rays. The direction in which the multilayer film mirror collimates the X-rays coincides with the width direction of the slit. The step size by which the sample is moved is smaller than the width of the slit. The combination of the size of the minute focal spot, the width of the slit, and the intensity of the X-rays that exit out of the multilayer film mirror allows the contrast of an X-ray image produced when the detector receives X-rays for a predetermined period of 1 minute or shorter to be high enough for observation of the X-ray image. |
