发明名称 Mass spectrometer method and mass spectrometer
摘要 A variation in an ionization efficiency and the amount of sample which is introduced into an ion trap is corrected and quantified. Ions of an internal standard and ions of a sample are trapped in the ion trap at the same time, and a concentration of the sample is quantified according to an intensity of the ions of the internal standard which are mass-selectively ejected, and an intensity of fragment ions of the sample.
申请公布号 US9076638(B2) 申请公布日期 2015.07.07
申请号 US201213365355 申请日期 2012.02.03
申请人 HITACHI-HIGH TECHNOLOGIES CORPORATION 发明人 Sugiyama Masuyuki;Hashimoto Yuichiro;Hasegawa Hideki;Hashiba Shuhei;Kumano Shun
分类号 H01J49/26;H01J49/00 主分类号 H01J49/26
代理机构 Mattingly & Malur, PC 代理人 Mattingly & Malur, PC
主权项 1. A mass spectrometric method comprising: ionizing a sample and an internal standard having a known concentration in an ion source; introducing sample ions and internal standard ions into an ion trap; accumulating the sample ions and the internal standard ions in the ion trap at the same time; mass-selectively ejecting and detecting the internal standard ions from the ion trap for each accumulating step of a measurement sequence of the ion trap, where the sample ions have been accumulated in the ion trap; and thereafter, isolating precursor ions from the sample ions in the ion trap; dissociating the precursor ions to generate fragment ions; mass-selectively ejecting and detecting the fragment ions from the ion trap for each accumulating step of the measurement sequence of the ion trap; and calculating a concentration of the sample on the basis of an intensity of the detected internal standard ions and an intensity of the dissociated fragment ions of the sample, where the internal standard ions and the sample ions are accumulated at the same accumulating step of the measurement sequence of the ion trap.
地址 Tokyo JP