APPARATUS AND METHOD FOR MEASURING MATERIAL THICKNESS

摘要

An apparatus and sys-tem for measuring material thickness of a test object. In one embodiment, the apparatus can include a measure-ment probe that can have a plurality of transducer elements that can in-clude transmitter elements and re-ceiver elements arranged, respective-ly, in on a first side and a second side of a gap. The first side and the sec-ond side can form a scan area with at least one active group that can have at least one transmitter element and at least one receiver element, which can be separated from the transmitter element in a spaced relationship.