发明名称 Method and device for self-aligned contact on a non-recessed metal gate
摘要 A methodology for forming a self-aligned contact (SAC) that exhibits reduced likelihood of a contact-to-gate short circuit failure and the resulting device are disclosed. Embodiments may include forming a replacement metal gate, with spacers at opposite sides thereof, on a substrate, forming a recess in an upper surface of the spacers along outer edges of the replacement metal gate, and forming an aluminum nitride (AlN) cap over the metal gate and in the recess.
申请公布号 US9076816(B2) 申请公布日期 2015.07.07
申请号 US201314080842 申请日期 2013.11.15
申请人 GLOBALFOUNDRIES Inc. 发明人 Zhang Xunyuan;Cai Xiuyu;Kim Hoon
分类号 H01L29/78;H01L29/66;H01L29/49 主分类号 H01L29/78
代理机构 Ditthavong & Steiner, P.C. 代理人 Ditthavong & Steiner, P.C.
主权项 1. A method comprising: forming a replacement metal gate, with spacers at opposite sides thereof and a barrier layer adjacent the spacers, on a substrate; forming a recess that penetrates an upper surface of the spacers, between an outer edge of the spacers and the barrier layer, and along outer edges of the replacement metal gate; and forming an aluminum nitride (AlN) cap over the metal gate and in the recess between the spacers and barrier layer.
地址 Grand Cayman KY