发明名称 Semiconductor device and method of dual-molding die formed on opposite sides of build-up interconnect structure
摘要 A semiconductor device has a first interconnect structure. A first semiconductor die has an active surface oriented towards and mounted to a first surface of the first interconnect structure. A first encapsulant is deposited over the first interconnect structure and first semiconductor die. A second semiconductor die has an active surface oriented towards and mounted to a second surface of the first interconnect structure opposite the first surface. A plurality of first conductive pillars is formed over the second surface of the first interconnect structure and around the second semiconductor die. A second encapsulant is deposited over the second semiconductor die and around the plurality of first conductive pillars. A second interconnect structure including a conductive layer and bumps are formed over the second encapsulant and electrically connect to the plurality of first conductive pillars and the first and second semiconductor die.
申请公布号 US9076803(B2) 申请公布日期 2015.07.07
申请号 US201314063274 申请日期 2013.10.25
申请人 STATS ChipPAC, Ltd. 发明人 Pagaila Reza A.
分类号 H01L23/48;H01L23/52;H01L29/40;H01L21/44;H01L21/48;H01L21/50;H01L21/56;H01L21/683;H01L23/498;H01L23/538;H01L23/552;H01L25/065;H01L23/31;H01L23/00 主分类号 H01L23/48
代理机构 Patent Law Group: Atkins and Associates, P.C. 代理人 Atkins Robert D.;Patent Law Group: Atkins and Associates, P.C.
主权项 1. A method of making a semiconductor device, comprising: providing a first semiconductor die including an active surface; depositing an encapsulant over the first semiconductor die; forming a first interconnect structure over the active surface of the first semiconductor die; disposing a second semiconductor component over the first interconnect structure and the active surface of the first semiconductor die; and forming a second interconnect structure over the first interconnect structure opposite the first semiconductor die.
地址 Singapore SG