| 发明名称 | Fuse information storage circuit of semiconductor apparatus | ||
| 摘要 | A test mode decoder configured to decode a test mode signal inputted a plurality of times and to generate preliminary fuse information, a count latch configured to count the preliminary fuse information in response to a count clock signal and to generate fuse information, and a fuse array block configured to store the fuse information can be included. | ||
| 申请公布号 | US9076538(B2) | 申请公布日期 | 2015.07.07 |
| 申请号 | US201314100168 | 申请日期 | 2013.12.09 |
| 申请人 | SK Hynix Inc. | 发明人 | Baek Chang Ki |
| 分类号 | G11C17/00;G11C17/16;G11C29/44 | 主分类号 | G11C17/00 |
| 代理机构 | William Park & Associates Ltd. | 代理人 | William Park & Associates Ltd. |
| 主权项 | 1. A fuse information storage circuit of a semiconductor apparatus, comprising: a test mode decoder configured to decode a test mode signal inputted a plurality of times, and to generate preliminary fuse information; a count latch configured to count the preliminary fuse information in response to a count clock signal, and to generate fuse information; and a fuse array block configured to store the fuse information. | ||
| 地址 | Gyeonggi-do KR | ||