发明名称 |
Spectrometer and method of operating same |
摘要 |
A spectrometer has a first and second light sources (12, 14) which generate light radiation (24) in a first and second wavelength ranges, and a mirror unit (16) for deflecting the light radiation (24, 26) into a measurement path (18), arranged so that the radiation of both wavelength ranges (24, 26) runs through on the same optical path. A detector (20) detects radiation (24, 26) running through the measurement path (18) and an evaluation unit (22) evaluates the radiation (24, 26) incident at the detector (20) and for determining a concentration of a measurement gas component present in the measurement path (18). The mirror unit (16) is configured as a micromirror array (32) and that a single micromirror (34) only deflects a portion of the radiation (24, 26). |
申请公布号 |
US9074930(B2) |
申请公布日期 |
2015.07.07 |
申请号 |
US201414220313 |
申请日期 |
2014.03.20 |
申请人 |
Sick AG |
发明人 |
Kaufmann Jurgen;Beyer Thomas;Edler Julian |
分类号 |
G01J3/10;G01J1/42;G01J3/42;G01J3/02 |
主分类号 |
G01J3/10 |
代理机构 |
Nath, Goldberg & Meyer |
代理人 |
Nath, Goldberg & Meyer ;Meyer Jerald L.;Protigal Stanley N. |
主权项 |
1. A spectrometer comprising:
a first light source (12) generating light radiation (24) in a first wavelength range at a first optical path; a second light source (14) generating light radiation (26) in a second wavelength range at a second optical path; a mirror unit (16) for deflecting the light radiation (24, 26) in the first and second wavelength ranges into a measurement path (18), wherein the radiation (24, 26) of both wavelength ranges runs through on the first and the second optical path which are the same; a detector (20) for detecting the radiation (24, 26) running through the measurement path (18); and an evaluation unit (22) for evaluating the radiation (24, 26) incident at the detector (20) and for determining a concentration of a measurement gas component present in the measurement path (18), wherein the mirror unit (16) is configured as a micromirror array (32) and wherein a single micromirror (34) only deflects a portion of the radiation (24, 26). |
地址 |
Waldkirch DE |