发明名称 |
Flash memory device using adaptive program verification scheme and related method of operation |
摘要 |
A method of programming a flash memory device comprises programming selected memory cells, performing a verification operation to determine whether the selected memory cells have reached a target program state, and determining a start point of the verification operation based on a programming characteristic associated with a detection of a pass bit during programming of an initial program state. |
申请公布号 |
US9076534(B2) |
申请公布日期 |
2015.07.07 |
申请号 |
US201313841503 |
申请日期 |
2013.03.15 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Yoon Sang Yong;Park Ki Tae;Kim Moo Sung;Kim Bo Geun;Yoon Hyun jun |
分类号 |
G11C16/10;G11C11/56;G11C16/34 |
主分类号 |
G11C16/10 |
代理机构 |
Volentine & Whitt, PLLC |
代理人 |
Volentine & Whitt, PLLC |
主权项 |
1. A method of programming a nonvolatile memory device, comprising:
applying a program voltage to selected memory cells; performing a first verification operation for a first program state by applying a first verification voltage to the selected memory cells; performing a second verification operation for a second program state by applying a second verification voltage to the selected memory cells; performing a first fail-bit counting operation for a result of the first verification operation; and selectively performing a second fail-bit counting operation for a result of the second verification operation based on a result of the first fail-bit counting operation, wherein the second verification voltage is higher than the first verification voltage. |
地址 |
Suwon-si, Gyeonggi-do KR |