发明名称 Flash memory device using adaptive program verification scheme and related method of operation
摘要 A method of programming a flash memory device comprises programming selected memory cells, performing a verification operation to determine whether the selected memory cells have reached a target program state, and determining a start point of the verification operation based on a programming characteristic associated with a detection of a pass bit during programming of an initial program state.
申请公布号 US9076534(B2) 申请公布日期 2015.07.07
申请号 US201313841503 申请日期 2013.03.15
申请人 Samsung Electronics Co., Ltd. 发明人 Yoon Sang Yong;Park Ki Tae;Kim Moo Sung;Kim Bo Geun;Yoon Hyun jun
分类号 G11C16/10;G11C11/56;G11C16/34 主分类号 G11C16/10
代理机构 Volentine & Whitt, PLLC 代理人 Volentine & Whitt, PLLC
主权项 1. A method of programming a nonvolatile memory device, comprising: applying a program voltage to selected memory cells; performing a first verification operation for a first program state by applying a first verification voltage to the selected memory cells; performing a second verification operation for a second program state by applying a second verification voltage to the selected memory cells; performing a first fail-bit counting operation for a result of the first verification operation; and selectively performing a second fail-bit counting operation for a result of the second verification operation based on a result of the first fail-bit counting operation, wherein the second verification voltage is higher than the first verification voltage.
地址 Suwon-si, Gyeonggi-do KR