In a method for manufacturing a semiconductor device, the present invention: forms a device separation film pattern on a substrate; defines a field region covered with the device separation film pattern and the first and second active regions which are not covered with the device separation film pattern and project to the upper part from the device separation film pattern; forms a first reflection protection film on the device separation pattern; forms first photoresist films on the first and second active regions on the substrate and the first reflection protection film; forms a first photoresist pattern covering the first active region by partially etching the first photoresist film; and forms a first impurity region by injecting ions into the second active region.
申请公布号
KR20150077022(A)
申请公布日期
2015.07.07
申请号
KR20130165828
申请日期
2013.12.27
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, TAE SUN;SEO, JAE KYUNG;KIM, JI HO;YOON, KWANG SUB;YOUN, BUM JOON;LEE, KI MAN