发明名称 FORMATION METHOD OF CONTACT LAYER
摘要 PROBLEM TO BE SOLVED: To provide a formation method of a contact layer capable of forming a contact layer without being affected by a base substrate.SOLUTION: When forming a contact layer 114 on a substrate 110 having a contact hole 112 for taking a contact between the substrate 110 and an implantation metal, the substrate 110 is arranged in a chamber, and Ti raw material gas, reduction gas and Si raw material gas are introduced, and they are changed into plasma to deposit a TiSix film 113 on the substrate 110, and a bottom part of the contact hole 112 of the TiSix film 113 is used as the contact layer 114.
申请公布号 JP2015124397(A) 申请公布日期 2015.07.06
申请号 JP20130267707 申请日期 2013.12.25
申请人 TOKYO ELECTRON LTD 发明人 MURAKAMI MASASHI;SHIMIZU TAKANARI;WAKABAYASHI SATORU
分类号 C23C16/42;H01L21/28;H01L21/285;H01L21/768 主分类号 C23C16/42
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