发明名称 |
TRANSISTOR WITH IMPROVED RADIATION HARDNESS |
摘要 |
An integrated circuit and method with a radiation hard transistor where the gate of the radiation hard transistor does not cross the boundary between active and isolation. |
申请公布号 |
US2015187957(A1) |
申请公布日期 |
2015.07.02 |
申请号 |
US201414584369 |
申请日期 |
2014.12.29 |
申请人 |
Texas Instruments Incorporated |
发明人 |
DING Hao;SRIDHAR Seetharaman |
分类号 |
H01L29/786;H01L29/66;H01L27/088 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
1. An integrated circuit, comprising:
a radiation hard MOS transistor, the radiation hard transistor further comprising: an active region in a substrate of the integrated circuit wherein the active region is surrounded by isolation dielectric; a radiation hard transistor gate on the active region wherein the radiation hard transistor gate does not cross a boundary between the active region and the isolation dielectric; a first portion of the radiation hard transistor gate over a first gate dielectric wherein the first gate dielectric overlies active adjacent to a channel of the radiation hard transistor; a second portion of the radiation hard transistor gate over a second gate dielectric and wherein the second gate dielectric overlies the channel; a source diffusion and a drain diffusion that is implanted self-aligned to the second portion; and silicide formed on a portion of the source diffusion and on a portion of the drain diffusion wherein the silicide does not short pn-junctions formed between the source diffusion and the drain diffusions and the substrate. |
地址 |
Dallas TX US |