发明名称 TRANSISTOR WITH IMPROVED RADIATION HARDNESS
摘要 An integrated circuit and method with a radiation hard transistor where the gate of the radiation hard transistor does not cross the boundary between active and isolation.
申请公布号 US2015187957(A1) 申请公布日期 2015.07.02
申请号 US201414584369 申请日期 2014.12.29
申请人 Texas Instruments Incorporated 发明人 DING Hao;SRIDHAR Seetharaman
分类号 H01L29/786;H01L29/66;H01L27/088 主分类号 H01L29/786
代理机构 代理人
主权项 1. An integrated circuit, comprising: a radiation hard MOS transistor, the radiation hard transistor further comprising: an active region in a substrate of the integrated circuit wherein the active region is surrounded by isolation dielectric; a radiation hard transistor gate on the active region wherein the radiation hard transistor gate does not cross a boundary between the active region and the isolation dielectric; a first portion of the radiation hard transistor gate over a first gate dielectric wherein the first gate dielectric overlies active adjacent to a channel of the radiation hard transistor; a second portion of the radiation hard transistor gate over a second gate dielectric and wherein the second gate dielectric overlies the channel; a source diffusion and a drain diffusion that is implanted self-aligned to the second portion; and silicide formed on a portion of the source diffusion and on a portion of the drain diffusion wherein the silicide does not short pn-junctions formed between the source diffusion and the drain diffusions and the substrate.
地址 Dallas TX US