发明名称 |
DEFECT INSPECTION DEVICE FOR DISPLAY PANEL AND METHOD FOR THE SAME |
摘要 |
The present invention provides a defect inspection method and device for a display panel. The defect inspection method comprises: A) obtaining an edge image of the display panel and obtaining a grayscale value of each pixel of the edge image; B) selecting a specific area in the edge image and obtaining a grayscale value of each pixel in the specific area; C) obtaining an average grayscale value of all pixels in the specific area; D) executing binarization for the grayscale value of each pixel in the specific area to obtain some boundary lines based on the average grayscale value, wherein the grayscale values of pixels on the boundary lines are different from grayscale values of the other pixels which are not on the boundary lines; E) filtering horizontal and vertical lines of the boundary lines to obtain some remaining boundary lines; and F) fitting a defect specification line for the remaining boundary lines, wherein, if widths of the remaining boundary lines are not smaller than a width of the defect specification line, confirming that the remaining boundary lines are defect lines. |
申请公布号 |
US2015187064(A1) |
申请公布日期 |
2015.07.02 |
申请号 |
US201414239126 |
申请日期 |
2014.01.09 |
申请人 |
Huang Haibo |
发明人 |
Huang Haibo |
分类号 |
G06T7/00 |
主分类号 |
G06T7/00 |
代理机构 |
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代理人 |
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主权项 |
1. A defect inspection method for a display panel, comprising:
A) obtaining an edge image of the display panel and obtaining a grayscale value of each pixel of the edge image; B)selecting a specific area in the edge image and obtaining a grayscale value of each pixel in the specific area; C) averaging the grayscale values of all pixels in the specific area to obtain an average grayscale value of all pixels in the specific area; D)executing binarization for the grayscale value of each pixel in the specific area to obtain some boundary lines based on the average grayscale value, wherein the grayscale values of pixels on the boundary lines are different from grayscale values of the other pixels which are not on the boundary lines; E) filtering horizontal and vertical lines of the boundary lines to obtain some remaining boundary lines; and F) fitting a defect specification line for the remaining boundary lines, wherein, if widths of the remaining boundary lines are not smaller than a width of the defect specification line, confirming that the remaining boundary lines are defect lines. |
地址 |
Shenzhen CN |