发明名称 COMPOSITION FOR TITANIUM NITRIDE HARD MASK AND ETCH RESIDUE REMOVAL
摘要 PROBLEM TO BE SOLVED: To provide a composition, system and process for selectively etching hard mask layers and/or etch residues relative to metal conductor layers and low-k dielectric layers that are present.SOLUTION: Aqueous compositions for stripping a titanium nitride (TiN or TiNxOy) hard mask and removing an etch residue are low pH aqueous composition comprising a solvent, a weakly coordinating anion, amine, and at least two non-oxidizing trace metal ions. The aqueous compositions contain no non-ambient oxidizer, and are exposed to air. Bifluoride or metal corrosion inhibitor may be added to the aqueous composition. Systems and processes use the aqueous compositions for stripping a titanium nitride (TiN or TiNxOy) hard mask and removing a titanium nitride (TiN or TiNxOy) etch residue.
申请公布号 JP2015122496(A) 申请公布日期 2015.07.02
申请号 JP20140257005 申请日期 2014.12.19
申请人 AIR PRODUCTS AND CHEMICALS INC 发明人 WILLIAM JACK CASTEEL JR;INAOKA SEIJI;MADHUKAR BHASKARA RAO;BRENDA FAYE ROSS;LEE YI-CHIA;LIU WEN DAR;CHEN TIANNIU
分类号 H01L21/308 主分类号 H01L21/308
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