DEVICE FOR MEASURING RESONANT INELASTIC X-RAY SCATTERING OF A SAMPLE

摘要

A device for measuring resonant inelastic X-ray scattering of a sample with a single exposure step includes a first reflection zone plate configured to be irradiated first and foremost by an X-ray beam. The device also includes a sample arranged at the focus of the diffracted radiation from the first reflection zone plate. The device additionally includes a second reflection zone plate arranged at a distance of its focal length from the sample. The device further includes a detector arranged at the focal plane of the diffracted radiation of the second reflection zone plate and configured to perform spatially-resolved two-dimensional detection. The reflection zone plates are arranged cross-dispersively. The wavelength ranges of the reflection zone plates are tuned to one another corresponding to an absorption edge of an element of the sample.