发明名称 METHOD FOR MEASURING REACTION RATE OF REACTIVE MESOGEN
摘要 A method for measuring a reaction rate of a reactive mesogen and an alignment layer formed thereby, the method including coating an alignment material on a substrate. The alignment material includes a backbone and a reactive mesogen connected to the backbone. The reactive mesogen includes an unsaturated bond. The alignment material is irradiated with ultraviolet light, or is heated, to form the alignment layer. A marking compound, including a thiol group is coated on the alignment layer and reacts with remaining unreacted reactive mesogen, to form a marked mesogen. An amount of the marked mesogen is detected. A reactive ratio is measured by comparing an amount of the reactive mesogen before irradiating or heating with an amount of the marked mesogen.
申请公布号 US2015185158(A1) 申请公布日期 2015.07.02
申请号 US201414282917 申请日期 2014.05.20
申请人 Samsung Display Co., Ltd. 发明人 LIM Ho;Kim Tae-Min
分类号 G01N21/77;G01N21/64 主分类号 G01N21/77
代理机构 代理人
主权项 1. A method for measuring a reaction rate of a reactive mesogen comprising: applying an alignment material to a substrate, the alignment material comprising alignment molecules that each comprise a backbone and a reactive mesogen connected to the backbone; reacting the reactive mesogen to form an alignment layer, by irradiating the alignment material with ultraviolet light having a first intensity, or by heating the alignment material; applying a marking compound comprising a thiol group to the alignment layer, the marking compound configured to react with any remaining unreacted reactive mesogen, thereby forming a marked mesogen; detecting an amount of the marked mesogen; and measuring a first reactive ratio by comparing an initial amount of the reactive mesogen with the detected amount of the marked mesogen.
地址 Yongin-city KR