| 摘要 |
PROBLEM TO BE SOLVED: To provide a microcrystal structure analysis method and a microcrystal structure analysis device which can perform structural analysis of microcrystal with a simple configuration.SOLUTION: A microcrystal structure analysis method comprises: a first detection step ST1 for detecting a first diffraction image of an X-ray irradiated to a specimen container in a state where the specimen container in which the microcrystal is suspended is rotated at constant speed with respect to a magnetic field generation part; a second detection step ST2 for detecting a second diffraction image of the X-ray irradiated to the specimen container in a state where the rotation of the specimen container is stopped with respect to the magnetic field generation part; first determination steps ST3, ST4, ST5 for determining the crystal system of the microcrystal, grating constant, Miller index and space group on the basis of the detected first diffraction image and second diffraction image; a second determination step ST6 for determining the diffraction intensity of the diffraction spot in each determined Miller index on the basis of the first diffraction image and the second diffraction image; and an analysis step ST7 for performing analysis processing on the basis of the determined diffraction intensity. |
