发明名称 |
SUBSTRATE PROCESSING APPARATUS, SHUTTER DEVICE AND PLASMA PROCESSING APPARATUS |
摘要 |
Abnormal discharge is suppressed from occurring within a chamber. A plasma processing apparatus 1 includes a cylindrical chamber 10 having an opening 51 through which a processing target substrate is loaded into the chamber; a deposition shield 71 which is provided along an inner wall of the chamber 10 and has an opening 71a at a position corresponding to the opening 51; and a shutter 55, having a plate shape, configured to open and close the opening 71a. Further, in a state that the opening 71a is closed by the shutter 55, an outer periphery of the shutter 55 is overlapped with the deposition shield 71 in a thickness direction of the shutter 55 and an inner periphery of the opening 71a is overlapped with the shutter 55 in the thickness direction of the shutter 55. |
申请公布号 |
US2015187542(A1) |
申请公布日期 |
2015.07.02 |
申请号 |
US201414580657 |
申请日期 |
2014.12.23 |
申请人 |
Tokyo Electron Limited |
发明人 |
Ishida Toshifumi |
分类号 |
H01J37/32 |
主分类号 |
H01J37/32 |
代理机构 |
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代理人 |
|
主权项 |
1. A substrate processing apparatus, comprising:
a cylindrical chamber having a first opening through which a processing target substrate is loaded into the chamber; a protection member which is provided along an inner wall of the chamber and has a second opening at a position corresponding to the first opening; and an opening/closing member, having a plate shape, configured to open and close the second opening, wherein, in a state that the second opening is closed by the opening/closing member, an outer periphery of the opening/closing member is overlapped with the protection member in a thickness direction of the opening/closing member, and an inner periphery of the second opening is overlapped with the opening/closing member in the thickness direction of the opening/closing member. |
地址 |
Tokyo JP |