发明名称 SUBSTRATE PROCESSING APPARATUS, SHUTTER DEVICE AND PLASMA PROCESSING APPARATUS
摘要 Abnormal discharge is suppressed from occurring within a chamber. A plasma processing apparatus 1 includes a cylindrical chamber 10 having an opening 51 through which a processing target substrate is loaded into the chamber; a deposition shield 71 which is provided along an inner wall of the chamber 10 and has an opening 71a at a position corresponding to the opening 51; and a shutter 55, having a plate shape, configured to open and close the opening 71a. Further, in a state that the opening 71a is closed by the shutter 55, an outer periphery of the shutter 55 is overlapped with the deposition shield 71 in a thickness direction of the shutter 55 and an inner periphery of the opening 71a is overlapped with the shutter 55 in the thickness direction of the shutter 55.
申请公布号 US2015187542(A1) 申请公布日期 2015.07.02
申请号 US201414580657 申请日期 2014.12.23
申请人 Tokyo Electron Limited 发明人 Ishida Toshifumi
分类号 H01J37/32 主分类号 H01J37/32
代理机构 代理人
主权项 1. A substrate processing apparatus, comprising: a cylindrical chamber having a first opening through which a processing target substrate is loaded into the chamber; a protection member which is provided along an inner wall of the chamber and has a second opening at a position corresponding to the first opening; and an opening/closing member, having a plate shape, configured to open and close the second opening, wherein, in a state that the second opening is closed by the opening/closing member, an outer periphery of the opening/closing member is overlapped with the protection member in a thickness direction of the opening/closing member, and an inner periphery of the second opening is overlapped with the opening/closing member in the thickness direction of the opening/closing member.
地址 Tokyo JP