发明名称 MICRO-ELECTRO MECHANICAL APPARATUS WITH PN-JUNCTION
摘要 A micro-electro mechanical apparatus having a PN-junction is provided. The micro-electro mechanical apparatus includes a movable mass, a conductive layer, and an electrode. The movable mass includes a P-type semiconductor layer and an N-type semiconductor layer. The PN-junction is formed between the P-type semiconductor layer and the N-type semiconductor layer. The micro-electro mechanical apparatus is capable of eliminating abnormal voltage signal when an alternating current passes through the conductive layer. The micro-electro mechanical apparatus is adapted to measure acceleration and magnetic field. The micro-electro mechanical apparatus can be other types of micro-electro mechanical apparatus such as micro-electro mechanical scanning micro-mirror.
申请公布号 US2015183632(A1) 申请公布日期 2015.07.02
申请号 US201414487104 申请日期 2014.09.16
申请人 Industrial Technology Research Institute 发明人 Su Chung-Yuan;Kuo Chin-Fu;Chen Chih-Yuan;Huang Chao-Ta
分类号 B81B3/00 主分类号 B81B3/00
代理机构 代理人
主权项 1. A micro-electro mechanical apparatus, comprising: a substrate including an electrode disposed on a top surface of the substrate; a movable mass, being disposed above the electrode, including: a first P-type semiconductor layer;a first N-type semiconductor layer connected to the first P-type semiconductor layer;a first PN-junction formed between the first P-type semiconductor layer and the first N-type semiconductor layer; a first conductive layer; and a first electrical insulation layer disposed between the movable mass and the first conductive layer.
地址 Hsinchu TW