发明名称 |
MICRO-ELECTRO MECHANICAL APPARATUS WITH PN-JUNCTION |
摘要 |
A micro-electro mechanical apparatus having a PN-junction is provided. The micro-electro mechanical apparatus includes a movable mass, a conductive layer, and an electrode. The movable mass includes a P-type semiconductor layer and an N-type semiconductor layer. The PN-junction is formed between the P-type semiconductor layer and the N-type semiconductor layer. The micro-electro mechanical apparatus is capable of eliminating abnormal voltage signal when an alternating current passes through the conductive layer. The micro-electro mechanical apparatus is adapted to measure acceleration and magnetic field. The micro-electro mechanical apparatus can be other types of micro-electro mechanical apparatus such as micro-electro mechanical scanning micro-mirror. |
申请公布号 |
US2015183632(A1) |
申请公布日期 |
2015.07.02 |
申请号 |
US201414487104 |
申请日期 |
2014.09.16 |
申请人 |
Industrial Technology Research Institute |
发明人 |
Su Chung-Yuan;Kuo Chin-Fu;Chen Chih-Yuan;Huang Chao-Ta |
分类号 |
B81B3/00 |
主分类号 |
B81B3/00 |
代理机构 |
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代理人 |
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主权项 |
1. A micro-electro mechanical apparatus, comprising:
a substrate including an electrode disposed on a top surface of the substrate; a movable mass, being disposed above the electrode, including:
a first P-type semiconductor layer;a first N-type semiconductor layer connected to the first P-type semiconductor layer;a first PN-junction formed between the first P-type semiconductor layer and the first N-type semiconductor layer; a first conductive layer; and a first electrical insulation layer disposed between the movable mass and the first conductive layer. |
地址 |
Hsinchu TW |