发明名称 |
METHOD FOR FABRICATING FIN TYPE TRANSISTOR |
摘要 |
A method for fabricating a fin type transistor uniformly implants in targeted regions. The method includes forming a fin protruding in a Z-axis direction from a substrate positioned on an XY. A first region and a second region are included in the substrate and a gate is formed crossing the second region in X-axis direction. An implantation is performed on at least a portion of the second region. The fin is rotated through a first angle, another implantation is performed on at least a portion of the second region, and the fin is rotated again through a second angle, different from the first angle. |
申请公布号 |
US2015187915(A1) |
申请公布日期 |
2015.07.02 |
申请号 |
US201414322014 |
申请日期 |
2014.07.02 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Joo Hyung-Jun;Kim Byong-Kuk;Song Ho-Gi;Joo Young-Byeong;Lee Samuel;Hong Seung-Gi |
分类号 |
H01L29/66 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
|
主权项 |
1. A method for fabricating a fin type transistor, the method comprising:
forming a fin protruding from a substrate positioned on an XY plane in a Z-axis direction, extending in a Y-axis direction and including a first region and a second region; forming a first gate crossing the second region in an X-axis direction; performing a first implantation on at least a portion of the second region; rotating the fin and substrate through a first angle in the XY plane; performing a second ion implantation on at least a portion of the second region; and rotating the fin and substrate through a second angle in the XY plane different from the first angle. |
地址 |
Suwon-si KR |