发明名称 THROUGH VIA CONTACTS WITH INSULATED SUBSTRATE
摘要 Device and a method of forming a device are disclosed. The method includes providing a crystalline-on-insulator (COI) substrate. The COI substrate includes at least a base substrate over a buried insulator layer. Through via (TV) contacts are formed within the substrate. The TV contact extends from a top surface of the base substrate to within the buried insulator layer. Upper interconnect levels are formed over the top surface of the base substrate. A lower redistribution (RDL) is formed over a bottom surface of the base substrate. The buried insulator layer corresponds to a first RDL dielectric layer of the lower RDL and protects the sidewalls of the TV contacts.
申请公布号 US2015187647(A1) 申请公布日期 2015.07.02
申请号 US201314140553 申请日期 2013.12.26
申请人 GLOBALFOUNDRIES Singapore Pte. Ltd. 发明人 GONG Shunqiang;TAN Juan Boon;LIU Wei
分类号 H01L21/768;H01L23/522 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method of forming a device comprising: providing a substrate, wherein the substrate comprises a buried oxide (BOX) layer sandwiched by a base substrate and a bottom substrate; forming a dielectric layer on the base substrate; forming through via (TV) contacts within the substrate, the TV contacts extend from a top surface of the dielectric layer to within the BOX layer of the substrate; forming upper interconnect levels on the base substrate over a top surface of the TV contacts, wherein the dielectric layer separates the upper interconnect levels from the base substrate; providing a carrier substrate over a top surface of the upper interconnect levels; and removing the bottom substrate and a portion of the BOX layer to expose a bottom surface of the TV contacts, wherein the remaining BOX layer serves as a first redistribution (RDL) dielectric layer of a lower RDL of the device.
地址 Singapore SG