| 摘要 |
The invention relates to active-pixel matrix image sensors comprising a photodiode and transistors in each pixel, having at least one transistor for controlling the reset of a (photodiode or floating diffusion) load storage area. To avoid resetting potential value errors in the large matrices, when the total reset for the entire matrix is desired, the falling edge of the reset command signal (GR/RST) is shifted in time before gradually applying shifted signals to the reset command lines. Thus-shifted individual command signals are applied to groups of X lines (X>=1). The command signals mutually overlap one another, however, in order to minimize the time needed to completely reset the entire matrix. Time delays or shift registers are used to produce individual signals having shifted falling edges. |
