发明名称 |
SUBSTRATE DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide an array substrate which can effectively prevent removal of an oxide conductive film and a silicon nitride film on the oxide conductive film without damaging the credibility.SOLUTION: A manufacturing method of an array substrate 16 comprises a surface treatment step and a nitride film formation step. The surface treatment step is a step of cleaning an oxide conductive film 49 without reduction by plasma discharge and etching a surface layer of an insulation film layer 48 which is not covered with the oxide conductive film 49 and a part of the insulation film layer 48 in a region covered with the oxide conductive film 49 to form a recess 55 which penetrates beneath the oxide conductive film 49. The nitride film formation step is a step of covering the recess 55 and the oxide conductive film 49 by plasma CVD following the surface treatment step to form a silicon nitride film 50. |
申请公布号 |
JP2015122449(A) |
申请公布日期 |
2015.07.02 |
申请号 |
JP20130266180 |
申请日期 |
2013.12.24 |
申请人 |
JAPAN DISPLAY INC |
发明人 |
FUKUMOTO YASUNORI;JINNAI NORIHIDE;SATO KOJI |
分类号 |
H01L21/768;G02F1/1368;H01L21/28;H01L21/283;H01L21/318;H01L21/336;H01L23/532;H01L29/786 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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