STRUCTURED ILLUMINATING MICROSCOPY APPARATUS

摘要

An acquiring unit of a structured illuminating microscopy apparatus acquires at least two modulated images having the same wave number vector and the different phases; and a calculating unit of the structured illuminating microscopy apparatus, in a spatial frequency spectrum of each of at least the two modulated images acquired by the acquiring unit, separates a 0th-order modulating component and ±first-order modulating components of observational light fluxes superimposed on arbitrary two observation points based on at least four observation values regarding the two observation points which are mutually displaced by an amount of the wave number vector.

主权项

1. A structured illuminating microscopy apparatus, comprising:
an illuminating optical system performing a spatial modulation on a sample by fringes; an image-forming optical system performing a modulating image formation of the sample by forming an image of an observational light flux from the sample being performed the spatial modulation; an acquiring unit controlling at least one of a wave number vector of the fringes and a phase of the fringes, and capturing a result of the modulating image formation to acquire a modulated image of the sample; and a calculating unit generating an image of the sample based on the modulated image acquired by the acquiring unit, wherein: the acquiring unit
acquires at least two modulated images each having the wave number vector being the same and the phase being different; and the calculating unit, in a spatial frequency spectrum of each of at least the two modulated images acquired by the acquiring unit,
separates a 0th-order modulating component and ±first-order modulating components of the observational light fluxes superimposed on arbitrary two observation points based on at least four observation values regarding the two observation points which are mutually displaced by an amount of the wave number vector.